Three-dimensional (3D) magnetic nanostructures exhibit novel magnetic phenomena driven by scale reduction and geometry, absent in bulk materials. These properties open new avenues for high-density nanoelectronics, data storage, and sensing technologies. However, patterning 3D nanomagnets remains an experimental bottleneck due to the scarcity of suitable synthesis methods.
Focused Electron Beam Induced Deposition (FEBID) has emerged as a powerful direct-write nanofabrication technique. It enables the growth of complex 3D nanostructures with near-arbitrary geometries, making it ideal for device prototyping and exploring topology-induced magnetic effects.
To understand nanoscale magnetic configurations, validate micromagnetic models, and optimize designs, quantitative local characterization is essential. In this context, off-axis electron holography stands out as a highly suitable nanometer-resolution quantitative magnetic imaging tool for nanoscale ferromagnets.
The lecture, presented by César Magén from INMA, will review the fundamental principles of electron holography and its key applications in 3D FEBID magnetic nanostructures. Supported by electron holography and related electron microscopy techniques, the talk highlights core challenges in controlling geometry, composition, and microstructure, alongside strategies to enhance magnetic performance.
Examples such as deposition optimization, post-growth processing, and heterostructuring will be presented. As a demonstration of combining FEBID optimization, advanced holography, and micromagnetic simulations, the observation of novel magnetic textures in FEBID-fabricated magnetic nanotubes will be showcased.
César Magén is a Research Scientist at the Instituto de Nanociencia y Materiales de Aragón (INMA). His research focuses on functional nanomaterials, particularly complex oxide thin films and nanoscale ferromagnets for spintronics and memory applications, investigated by advanced scanning transmission electron microscopy (STEM) techniques and electron holography.




